"Design of Robust-Path-Delay-Fault-Testable Combinational Circuits by ..."

Xiaodong Xie, Alexander Albicki, Andrzej Krasniewski (1992)

> Home

Details and statistics

DOI: 10.1109/ICCD.1992.276321

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/iccd/XieAK92
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccd/XieAK92
Xiaodong Xie, Alexander Albicki, Andrzej Krasniewski:
Design of Robust-Path-Delay-Fault-Testable Combinational Circuits by Boolean Space Expansion. ICCD 1992: 482-485

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.