"REEM: Failure/non-failure region estimation method for SRAM yield analysis."

Manish Rana, Ramon Canal (2014)

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DOI: 10.1109/ICCD.2014.6974659

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Manish Rana, Ramon Canal:
REEM: Failure/non-failure region estimation method for SRAM yield analysis. ICCD 2014: 36-41

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