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"Electromigration median time-to-failure based on a stochastic current ..."

Farid N. Najm, Ibrahim N. Hajj, Ping Yang (1989)

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DOI: 10.1109/ICCD.1989.63406

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-28

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  - conf/iccd/NajmHY89
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Farid N. Najm, Ibrahim N. Hajj, Ping Yang:
Electromigration median time-to-failure based on a stochastic current waveform. ICCD 1989: 447-450

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