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"An automatic test pattern generation program for large ASICs."

Dick L. Liu, Rajesh Galivanche, Charlie C. Hsu (1989)

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DOI: 10.1109/ICCD.1989.63364

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-28

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Dick L. Liu, Rajesh Galivanche, Charlie C. Hsu:
An automatic test pattern generation program for large ASICs. ICCD 1989: 244-248

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