Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"An Extended Class of Sequential Circuits with Combinational Test ..."

Michiko Inoue, Chikateru Jinno, Hideo Fujiwara (2002)

> Home

Details and statistics

DOI: 10.1109/ICCD.2002.1106770

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/iccd/InoueJF02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccd/InoueJF02
Michiko Inoue, Chikateru Jinno, Hideo Fujiwara:
An Extended Class of Sequential Circuits with Combinational Test Generation Complexity. ICCD 2002: 200-205

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.