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"Current sensing for built-in testing of CMOS circuits."

Derek Feltham et al. (1988)

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DOI: 10.1109/ICCD.1988.25742

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-28

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Derek Feltham, Phil Nigh, L. Richard Carley, Wojciech Maly:
Current sensing for built-in testing of CMOS circuits. ICCD 1988: 454-457

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