"Characterization of granularity and redundancy for SRAMs for optimal ..."

Jae Chul Cha, Sandeep K. Gupta (2008)

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DOI: 10.1109/ICCD.2008.4751865

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-26

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Jae Chul Cha, Sandeep K. Gupta:
Characterization of granularity and redundancy for SRAMs for optimal yield-per-area. ICCD 2008: 219-226

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