"STT-RAM cell design optimization for persistent and non-persistent error ..."

Yaojun Zhang, Xiaobin Wang, Yiran Chen (2011)

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DOI: 10.1109/ICCAD.2011.6105370

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yaojun Zhang, Xiaobin Wang, Yiran Chen:
STT-RAM cell design optimization for persistent and non-persistent error rate reduction: A statistical design view. ICCAD 2011: 471-477

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