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"On primitive fault test generation in non-scan sequential circuits."

Ramesh C. Tekumalla, Premachandran R. Menon (1998)

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DOI: 10.1145/288548.288625

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/iccad/TekumallaM98
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/TekumallaM98
Ramesh C. Tekumalla, Premachandran R. Menon:
On primitive fault test generation in non-scan sequential circuits. ICCAD 1998: 275-282

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