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"Impulse response fault model and fault extraction for functional level ..."

Chauchin Su, Shenshung Chiang, Shyh-Jye Jou (1995)

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DOI: 10.1109/ICCAD.1995.480195

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Chauchin Su, Shenshung Chiang, Shyh-Jye Jou:
Impulse response fault model and fault extraction for functional level analog circuit diagnosis. ICCAD 1995: 631-636

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