"Validation and test generation for oscillatory noise in VLSI interconnects."

Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer (1999)

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DOI: 10.1109/ICCAD.1999.810664

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-21

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Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer:
Validation and test generation for oscillatory noise in VLSI interconnects. ICCAD 1999: 289-296

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