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"Test Generation for Synchronous Sequential Circuits Based on Fault Extraction."

Irith Pomeranz, Sudhakar M. Reddy (1991)

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DOI: 10.1109/ICCAD.1991.185301

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/PomeranzR91
Irith Pomeranz, Sudhakar M. Reddy:
Test Generation for Synchronous Sequential Circuits Based on Fault Extraction. ICCAD 1991: 450-453

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