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"Test generation for sequential circuits using individual initial value ..."

Takuji Ogihara, Shuichi Saruyama, Shinichi Murai (1988)

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DOI: 10.1109/ICCAD.1988.122573

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/iccad/OgiharaSM88
Takuji Ogihara, Shuichi Saruyama, Shinichi Murai:
Test generation for sequential circuits using individual initial value propagation. ICCAD 1988: 242-247

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