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"Large-scale atomistic approach to random-dopant-induced characteristic ..."

Yiming Li et al. (2008)

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DOI: 10.1109/ICCAD.2008.4681586

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/iccad/LiHYL08
Yiming Li, Chih-Hong Hwang, Ta-Ching Yeh, Tien-Yeh Li:
Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits. ICCAD 2008: 278-285

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