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"Spatial correlation modeling for probe test cost reduction in RF devices."

Nathan Kupp et al. (2012)

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DOI: 10.1145/2429384.2429390

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-27

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/KuppHCM12
Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris:
Spatial correlation modeling for probe test cost reduction in RF devices. ICCAD 2012: 23-29

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