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"Driving toward higher IDDQ test quality for sequential circuits: a ..."

Hisashi Kondo, Kwang-Ting Cheng (1996)

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DOI: 10.1109/ICCAD.1996.569610

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/iccad/KondoC96
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/KondoC96
Hisashi Kondo, Kwang-Ting Cheng:
Driving toward higher IDDQ test quality for sequential circuits: a generalized fault model and its ATPG. ICCAD 1996: 228-232

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