"An assessment of vulnerability of hardware neural networks to dynamic ..."

Xun Jiao et al. (2017)

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DOI: 10.1109/ICCAD.2017.8203882

access: closed

type: Conference or Workshop Paper

metadata version: 2018-04-09

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  - https://dblp.org/rec/conf/iccad/JiaoLLG17
Xun Jiao, Mulong Luo, Jeng-Hau Lin, Rajesh K. Gupta:
An assessment of vulnerability of hardware neural networks to dynamic voltage and temperature variations. ICCAD 2017: 945-950

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