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"Test quality and yield analysis using the DEFAM defect to fault mapper."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Dinesh D. Gaitonde, Duncan M. Hank Walker (1993)

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DOI: 10.1109/ICCAD.1993.580056

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/iccad/GaitondeW93
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/GaitondeW93
Dinesh D. Gaitonde, Duncan M. Hank Walker:
Test quality and yield analysis using the DEFAM defect to fault mapper. ICCAD 1993: 202-205

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