Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Automatic Test Configuration and Pattern Generation (ATCPG) for ..."

I-Wei Chiu et al. (2022)

> Home

Details and statistics

DOI: 10.1145/3508352.3549422

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-06

- view
  authority control:
- export record
  dblp key:
  - conf/iccad/ChiuCHL22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccad/ChiuCHL22
I-Wei Chiu, Xin-Ping Chen, Jennifer Shueh-Inn Hu, James Chien-Mo Li:
Automatic Test Configuration and Pattern Generation (ATCPG) for Neuromorphic Chips. ICCAD 2022: 30:1-30:7

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.