"The need and opportunities of electromigration-aware integrated circuit ..."

Steve Bigalke et al. (2018)

> Home

Details and statistics

DOI: 10.1145/3240765.3265971

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-09

- view
  authority control:
- export record
  dblp key:
  - conf/iccad/BigalkeLJSJ18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccad/BigalkeLJSJ18
Steve Bigalke, Jens Lienig, Göran Jerke, Jürgen Scheible, Roland Jancke:
The need and opportunities of electromigration-aware integrated circuit design. ICCAD 2018: 96

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.