"Parametric test development for RF circuits targeting physical fault ..."

Erkan Acar, Sule Ozev (2005)

Details and statistics

DOI: 10.1109/ICCAD.2005.1560043

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics