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"Local Binary Pattern Symmetric Centre Feature Extraction Method for ..."

M. Pavan Kalyan, D. Kishore, Mahesh K. Singh (2021)

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DOI: 10.1007/978-3-031-21385-4_8

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-19

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M. Pavan Kalyan, D. Kishore, Mahesh K. Singh:
Local Binary Pattern Symmetric Centre Feature Extraction Method for Detection of Image Forgery. ICAIDS 2021: 89-100

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