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"Identification of External Defects on Fruits Using Deep Learning."

Henrique Tavares Aguiar, Raimundo C. S. Vasconcelos (2022)

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DOI: 10.1007/978-3-031-04881-4_45

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-18

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  dblp key:
  - conf/ibpria/AguiarV22
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  - https://dblp.org/rec/conf/ibpria/AguiarV22
Henrique Tavares Aguiar, Raimundo C. S. Vasconcelos:
Identification of External Defects on Fruits Using Deep Learning. IbPRIA 2022: 565-575

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