"Attention-Enhanced YOLO Model for High-Precision Detection of Internal ..."

Wenxin Niu et al. (2025)

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DOI: 10.1109/I2MTC62753.2025.11079129

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type: Conference or Workshop Paper

metadata version: 2025-07-31

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Wenxin Niu, Jianqiang Mei, Dawei Zhang, Yue Li, Fan Jia, Dandan Zheng:
Attention-Enhanced YOLO Model for High-Precision Detection of Internal Chip Defects in Ultrasonic Imagery. I2MTC 2025: 1-6

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