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"Split ADC background self-calibration of a 16-b successive approximation ..."

John A. McNeill et al. (2013)

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DOI: 10.1109/I2MTC.2013.6555430

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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John A. McNeill, Christopher L. David, Michael C. W. Coln, Ka Yan Chan, Cody Brenneman:
Split ADC background self-calibration of a 16-b successive approximation ADC in 180nm CMOS. I2MTC 2013: 310-313

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