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"Noises depression based on statistic analysis algorithm for Kerma area ..."

Chi-Wen Hsieh, Chih-Yen Chen (2018)

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DOI: 10.1109/I2MTC.2018.8409592

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-19

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  dblp key:
  - conf/i2mtc/HsiehC18
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  - https://dblp.org/rec/conf/i2mtc/HsiehC18
Chi-Wen Hsieh, Chih-Yen Chen:
Noises depression based on statistic analysis algorithm for Kerma area product meter design. I2MTC 2018: 1-5

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