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"Electrical Resistance Tomography using High And Low Conductivity Calibration."

Kai Gao et al. (2020)

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DOI: 10.1109/I2MTC43012.2020.9128990

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-16

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  dblp key:
  - conf/i2mtc/GaoCXW20
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  persistent URL:
  - https://dblp.org/rec/conf/i2mtc/GaoCXW20
Kai Gao, Ziqiang Cui, Zihan Xia, Huaxiang Wang:
Electrical Resistance Tomography using High And Low Conductivity Calibration. I2MTC 2020: 1-6

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