"SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory ..."

Feng Qin, Shan Lu, Yuanyuan Zhou (2005)

> Home

Details and statistics

DOI: 10.1109/HPCA.2005.29

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/hpca/QinLZ05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/hpca/QinLZ05
Feng Qin, Shan Lu, Yuanyuan Zhou:
SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs. HPCA 2005: 291-302

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.