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"DUO: Exposing On-Chip Redundancy to Rank-Level ECC for High Reliability."

Seong-Lyong Gong et al. (2018)

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DOI: 10.1109/HPCA.2018.00064

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  dblp key:
  - conf/hpca/GongKLSDE18
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  persistent URL:
  - https://dblp.org/rec/conf/hpca/GongKLSDE18
Seong-Lyong Gong, Jungrae Kim, Sangkug Lym, Michael B. Sullivan, Howard David, Mattan Erez:
DUO: Exposing On-Chip Redundancy to Rank-Level ECC for High Reliability. HPCA 2018: 683-695

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