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"DUO: Exposing On-Chip Redundancy to Rank-Level ECC for High Reliability."
Seong-Lyong Gong et al. (2018)
- Seong-Lyong Gong, Jungrae Kim, Sangkug Lym, Michael B. Sullivan, Howard David, Mattan Erez:
DUO: Exposing On-Chip Redundancy to Rank-Level ECC for High Reliability. HPCA 2018: 683-695
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