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"Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact ..."

Duhyun Jeon et al. (2022)

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DOI: 10.1109/HOST54066.2022.9839746

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-15

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Duhyun Jeon, Dongmin Lee, Dong Kyue Kim, Byong-Deok Choi:
Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact Failure Probability in 180 nm, 130 nm, and 28 nm CMOS Processes. HOST 2022: 85-88

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