Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Optimizing built-in pseudo-random self-testing for network-on-chip switches."

Simone Terenzi, Alessandro Strano, Davide Bertozzi (2012)

> Home

Details and statistics

DOI: 10.1145/2107763.2107769

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/hipeac/TerenziSB12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/hipeac/TerenziSB12
Simone Terenzi, Alessandro Strano, Davide Bertozzi:
Optimizing built-in pseudo-random self-testing for network-on-chip switches. INA-OCMC@HiPEAC 2012: 21-24

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.