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"Built-in generation of functional broadside tests considering primary ..."

Bo Yao et al. (2014)

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DOI: 10.1145/2591513.2591560

access: closed

type: Conference or Workshop Paper

metadata version: 2021-03-16

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  - conf/glvlsi/YaoPVA14
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Bo Yao, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen:
Built-in generation of functional broadside tests considering primary input constraints. ACM Great Lakes Symposium on VLSI 2014: 237-238

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