"Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide ..."

Chin-Long Wey et al. (2004)

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DOI: 10.1145/988952.989030

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba:
Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. ACM Great Lakes Symposium on VLSI 2004: 322-327

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