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"An on-chip solution for static ADC test and measurement."

Brendan Mullane et al. (2009)

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DOI: 10.1145/1531542.1531564

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/glvlsi/MullaneMOF09
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Brendan Mullane, Ciaran MacNamee, Vincent O'Brien, Thomas Fleischmann:
An on-chip solution for static ADC test and measurement. ACM Great Lakes Symposium on VLSI 2009: 81-86

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