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"A new test pattern generator for high defect coverage in a BIST environment."

Costas Laoudias, Dimitris Nikolos (2004)

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DOI: 10.1145/988952.989052

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-24

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Costas Laoudias, Dimitris Nikolos:
A new test pattern generator for high defect coverage in a BIST environment. ACM Great Lakes Symposium on VLSI 2004: 417-420

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