"Test generation using SAT-based bounded model checking for validation of ..."

Heon-Mo Koo, Prabhat Mishra (2006)

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DOI: 10.1145/1127908.1127991

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

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Heon-Mo Koo, Prabhat Mishra:
Test generation using SAT-based bounded model checking for validation of pipelined processors. ACM Great Lakes Symposium on VLSI 2006: 362-365

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