"A highly regular multi-phase reseeding technique for scan-based BIST."

Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos (2003)

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DOI: 10.1145/764808.764885

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos:
A highly regular multi-phase reseeding technique for scan-based BIST. ACM Great Lakes Symposium on VLSI 2003: 295-298

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