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"RFAM: RESET-Failure-Aware-Model for HfO2-based Memristor to Enhance the ..."
Hritom Das et al. (2023)
- Hritom Das, Manu Rathore, Rocco Febbo, Maximilian Liehr, Nathaniel C. Cady, Garrett S. Rose:
RFAM: RESET-Failure-Aware-Model for HfO2-based Memristor to Enhance the Reliability of Neuromorphic Design. ACM Great Lakes Symposium on VLSI 2023: 281-286
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