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"An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation."

H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus (1997)

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DOI: 10.1109/GLSV.1997.580503

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/glvlsi/DahmenGV97
H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus:
An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation. Great Lakes Symposium on VLSI 1997: 112-117

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