"An efficient linearity test for on-chip high speed ADC and DAC using ..."

Ji Hwan (Paul) Chun, Hak-soo Yu, Jacob A. Abraham (2004)

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DOI: 10.1145/988952.989031

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Ji Hwan (Paul) Chun, Hak-soo Yu, Jacob A. Abraham:
An efficient linearity test for on-chip high speed ADC and DAC using loop-back. ACM Great Lakes Symposium on VLSI 2004: 328-331

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