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"Efficient Testing of Tree Circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Ronald D. Blanton, John P. Hayes (1993)

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DOI: 10.1109/FTCS.1993.627321

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Ronald D. Blanton, John P. Hayes:
Efficient Testing of Tree Circuits. FTCS 1993: 176-185

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