"Research on a Security Chip Power-Down Test Method Based on MP300 Device."

Qingqin Fu et al. (2019)

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DOI: 10.3233/FAIA190260

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Qingqin Fu, Jun Liu, Rui Nie, Zhengquan Ang, Jia Liu, Zheng Li, Ling Yi, Pingjiang Xu, Yujie Shi, Zhaoqing Liang, Jiahui Yuan:
Research on a Security Chip Power-Down Test Method Based on MP300 Device. FSDM 2019: 870-875

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