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"Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs."

Ibrahim Ahmed et al. (2018)

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DOI: 10.1109/FPL.2018.00020

access: closed

type: Conference or Workshop Paper

metadata version: 2019-02-18

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  dblp key:
  - conf/fpl/AhmedZMTB18
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  - https://dblp.org/rec/conf/fpl/AhmedZMTB18
Ibrahim Ahmed, Shuze Zhao, James Meijers, Olivier Trescases, Vaughn Betz:
Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs. FPL 2018: 68-75

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