"Exploiting Memory Device Wear-Out Dynamics to Improve NAND Flash Memory ..."

Yangyang Pan, Guiqiang Dong, Tong Zhang (2011)

> Home

Details and statistics

DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2013-04-18

- view
  - electronic edition @ usenix.org
- export record
  dblp key:
  - conf/fast/PanDZ11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/fast/PanDZ11
Yangyang Pan, Guiqiang Dong, Tong Zhang:
Exploiting Memory Device Wear-Out Dynamics to Improve NAND Flash Memory System Performance. FAST 2011: 245-258

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.