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"Characterization of CMOS sequential standard cells for defect based ..."

Andrzej Wielgus, Witold A. Pleskacz (2008)

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DOI: 10.1109/EWDTS.2008.5580155

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - conf/ewdts/WielgusP08
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  persistent URL:
  - https://dblp.org/rec/conf/ewdts/WielgusP08
Andrzej Wielgus, Witold A. Pleskacz:
Characterization of CMOS sequential standard cells for defect based voltage testing. EWDTS 2008: 49-54

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