"Generalized test automation method for MOSFET's including characteristics ..."

Konstantin O. Petrosyants et al. (2017)

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DOI: 10.1109/EWDTS.2017.8110055

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Mamed R. Ismail-Zade:
Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications. EWDTS 2017: 1-8

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