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"Merit based directed random test generation (MDRTG) scheme for ..."

Arezoo Kamran, Mohammad Saeed Jahangiry, Zainalabedin Navabi (2010)

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DOI: 10.1109/EWDTS.2010.5742157

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - conf/ewdts/KamranJN10
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  - https://dblp.org/rec/conf/ewdts/KamranJN10
Arezoo Kamran, Mohammad Saeed Jahangiry, Zainalabedin Navabi:
Merit based directed random test generation (MDRTG) scheme for combinational circuits. EWDTS 2010: 416-419

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