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"Modeling transistor level masking of soft errors in combinational circuits."

Ihsen Alouani et al. (2015)

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DOI: 10.1109/EWDTS.2015.7493140

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/ewdts/AlouaniNHR15
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  persistent URL:
  - https://dblp.org/rec/conf/ewdts/AlouaniNHR15
Ihsen Alouani, Smaïl Niar, Yassin El Hillali, Atika Rivenq-Menhaj:
Modeling transistor level masking of soft errors in combinational circuits. EWDTS 2015: 1-4

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