Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Using Interleaving to Avoid the Effects of Multiple Adjacent Faults in ..."

Luis J. Saiz-Adalid et al. (2013)

> Home

Details and statistics

DOI: 10.1007/978-3-642-38789-0_20

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ewdc/Saiz-AdalidGGB13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ewdc/Saiz-AdalidGGB13
Luis J. Saiz-Adalid, Pedro J. Gil, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo:
Using Interleaving to Avoid the Effects of Multiple Adjacent Faults in On-Chip Interconnection Lines. EWDC 2013: 198-201

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.