"Linear feature detectors and their application to cereal inspection."

Edward Roy Davies et al. (1998)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-09

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  dblp key:
  - conf/eusipco/DaviesMBCR98
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  persistent URL:
  - https://dblp.org/rec/conf/eusipco/DaviesMBCR98
Edward Roy Davies, D. R. Mason, Michael Bateman, J. Chambers, C. Ridgway:
Linear feature detectors and their application to cereal inspection. EUSIPCO 1998: 1-4

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